Commercial semi-automatic probe stations

This Sources Sought Notice (NIST-SS26-CHIPS-44) seeks information regarding commercial semi-automatic probe stations for silicon carbide field effect transistor (FET) research. The minimum requirements include compatibility with low-noise, blade-style probe tips, a heated wafer chuck (at least 200°C), a digital microscope (5 μm imaging), user-friendly software, and vibration isolation. Responses are requested to identify potential barriers to participation, company size (small or other than small business), relevant experience (prime, subcontractor, or consultant), existing Federal Supply Schedule contracts, and capabilities meeting NIST’s requirements. Interested parties are encouraged to submit information by December 19, 2025, and are invited to submit questions by December 12, 2025. This notice is for market research purposes only and does not constitute a commitment to issue a solicitation or award a contract.

Notice ID

2048beb27a7448dda521147c3a57892a

Solicitation Number

NIST-SS26-CHIPS-44

NAICS Code

N/A

Classification Code

N/A