Commercial semi-automatic probe stations

This Sources Sought Notice (NIST-SS26-CHIPS-44) is for a commercial semi-automatic probe station to support microelectronics research related to silicon carbide FETs. The National Institute of Standards and Technology (NIST) seeks information on potential vendors capable of providing a system meeting minimum requirements including support for 300mm wafers, 40µm x 40µm probing capability with 60µm pitch, a heated wafer chuck (minimum 200°C), a digital microscope capable of imaging 5µm features, user-friendly software, and vibration isolation. Respondents are requested to provide company information, capabilities related to the requirements, relevant past performance, and feedback on potential barriers to entry, including suggestions for encouraging small business participation. Responses, submitted in Word, Excel, or PDF format to Cielo Ibarra (cielo.ibarra@nist.gov) by December 19, 2025, should *not* include proprietary information and will be used for market research purposes only; no award will be made as a result of this notice.

Notice ID

3e21539822cb4606805ba722636a78e5

Solicitation Number

NIST-SS26-CHIPS-44

NAICS Code

N/A

Classification Code

N/A