Commercial semi-automatic probe stations

This is a Sources Sought Notice (NIST-SS26-CHIPS-44) for a commercial semi-automatic probe station to support research on silicon carbide field effect transistors. The National Institute of Standards and Technology (NIST) is conducting market research to assess capabilities for a system capable of probing wafers up to 300mm in diameter, with specific requirements including low-noise blade-style probe tips, a heated wafer chuck (minimum 200°C), a digital microscope (5µm feature imaging), user-friendly software, and vibration isolation. Responses are requested to identify potential vendors, assess their experience with similar systems, and gather feedback on the requirements – specifically regarding any unduly restrictive aspects or suggestions for encouraging small business participation. Interested parties are asked to provide company information, NAICS code, relevant past performance, and details on capabilities exceeding NIST’s minimum requirements by December 19, 2025. This notice is for information gathering only and does not constitute a commitment to issue a solicitation or award a contract.

Notice ID

72a81e77765948c3ad976c12c14120d6

Solicitation Number

NIST-SS26-CHIPS-44

NAICS Code

N/A

Classification Code

N/A