66--Plasma-focused ion beam scanning electron microsco
Posted
Sep 22, 2025
Location
N/A, N/A, N/A
Description
https://api.sam.gov/prod/opportunities/v1/noticedesc?noticeid=80c2a6c7c34c4f9384f04ebda0e6bc9f
Details
- Notice ID
- 80c2a6c7c34c4f9384f04ebda0e6bc9f
- Solicitation Number
- 75N92025Q00101
- NAICS Code
- 334515
- Classification Code
- 6640
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