Kontratar

Atomic Force Microscope for use in a Scanning Electron Microscope

SAM
N/A
Sources Sought

Posted

Dec 4, 2025

Due Date

Dec 17, 2025

Location

Gaithersburg, Maryland

Description

https://api.sam.gov/prod/opportunities/v1/noticedesc?noticeid=b6a1b2644f1644e2b7d2e709ea06d497

Details

Notice ID
b6a1b2644f1644e2b7d2e709ea06d497
Solicitation Number
NIST-SS26-CHIPS-34
NAICS Code
334516
Classification Code
6640

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