Kontratar

Optical Microscope

SAM
N/A
Sources Sought

Posted

Dec 9, 2025

Due Date

Dec 23, 2025

Location

Gaithersburg, Maryland

Description

https://api.sam.gov/prod/opportunities/v1/noticedesc?noticeid=cfdd5ff1a6cc465fb2e3284567e76a1c

AI Summary

This is a Sources Sought Notice for an optical microscope to support nondestructive defect detection metrology for semiconductor advanced packaging research and development. The microscope must be an upright, reflected light microscope with LED light sources, capable of bright field, dark field, and differential interference contrast imaging, and equipped with motorized stages and an encoded objective turret holding at least five infinity-corrected objective lenses (5x, 10x, 20x, 50x, and 100x magnification). Stronger consideration will be given to higher numerical aperture lenses and encoded/motorized capabilities. Responses are requested to include company information (including UEI if registered in SAM.gov), capabilities related to magneto-resistive sensor design and manufacture, relevant past performance, identification of any unduly restrictive requirements, Federal Supply Schedule contract information, and suggestions for small business participation. Responses should not include proprietary information and are due by 5:00 p.m. Eastern Time on December 23, 2025. Questions regarding this notice must be submitted by December 15, 2025.

Details

Notice ID
cfdd5ff1a6cc465fb2e3284567e76a1c
Solicitation Number
NIST-SS26-CHIPS-42
NAICS Code
N/A
Classification Code
N/A

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